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NASA-LLIS-1300
Lessons Learned – Review Test Procedure for Circuit Voltage Compatibility (2000)
Year: 2002
Abstract: Abstract:
A 500-volt insulation/isolation resistance test intended for the propellant line heaters and tank heaters was mistakenly applied to all electrical connections in the Space Infrared Telescope Facility (SIRTF) propulsion subsystem, caused the failure of 6 pressure transducers.
Test procedures should protect flight hardware by specifying all voltage limitations. Before approving the test procedures, the cognizant subsystem engineer must perform a careful, detailed review both for functionality and to preclude injury to personnel or damage to the hardware.
A 500-volt insulation/isolation resistance test intended for the propellant line heaters and tank heaters was mistakenly applied to all electrical connections in the Space Infrared Telescope Facility (SIRTF) propulsion subsystem, caused the failure of 6 pressure transducers.
Test procedures should protect flight hardware by specifying all voltage limitations. Before approving the test procedures, the cognizant subsystem engineer must perform a careful, detailed review both for functionality and to preclude injury to personnel or damage to the hardware.
Subject: excess voltage
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| contributor author | NASA - National Aeronautics and Space Administration (NASA) | |
| date accessioned | 2017-09-04T18:07:46Z | |
| date available | 2017-09-04T18:07:46Z | |
| date copyright | 08/28/2002 | |
| date issued | 2002 | |
| identifier other | GPVEQCAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsery=autho162s7D8308/handle/yse/190702 | |
| description abstract | Abstract: A 500-volt insulation/isolation resistance test intended for the propellant line heaters and tank heaters was mistakenly applied to all electrical connections in the Space Infrared Telescope Facility (SIRTF) propulsion subsystem, caused the failure of 6 pressure transducers. Test procedures should protect flight hardware by specifying all voltage limitations. Before approving the test procedures, the cognizant subsystem engineer must perform a careful, detailed review both for functionality and to preclude injury to personnel or damage to the hardware. | |
| language | English | |
| title | NASA-LLIS-1300 | num |
| title | Lessons Learned – Review Test Procedure for Circuit Voltage Compatibility (2000) | en |
| type | standard | |
| page | 3 | |
| status | Active | |
| tree | NASA - National Aeronautics and Space Administration (NASA):;2002 | |
| contenttype | fulltext | |
| subject keywords | excess voltage | |
| subject keywords | Flight Equipment | |
| subject keywords | Ground Equipment | |
| subject keywords | Hardware | |
| subject keywords | over voltage | |
| subject keywords | Spacecraft | |
| subject keywords | Test & Verification | |
| subject keywords | Test Article | |
| subject keywords | test error | |
| subject keywords | Test Facility | |
| subject keywords | test induced failure | |
| subject keywords | voltage rating |