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Surface Organic Contaminant Identification Test (Infrared Analytical Method)

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T18:42:30Z
date available2017-09-04T18:42:30Z
date copyright05/01/2004
date issued2004
identifier otherJZOHFBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;jsery=autho162s7D83081DAC426159DD6EFDEC014A/handle/yse/223931
description abstractThis infrared spectrophotometric analysis test method is for use in identifying the nature of nonionic organic contaminants present on printed wiring board surfaces or on the contaminated microscope slide used in the solvent extraction procedure defined in IPC-TM-650, Test Method 2.3.38, by use of the Multiple Internal Reflectance (MIR) Method. This test should be performed only by an experienced spectroscopist.
languageEnglish
titleIPC TM-650 2.3.39Cnum
titleSurface Organic Contaminant Identification Test (Infrared Analytical Method)en
typestandard
page4
statusActive
treeIPC - Association Connecting Electronics Industries:;2004
contenttypefulltext


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