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IPC TM-650 2.3.39C
Surface Organic Contaminant Identification Test (Infrared Analytical Method)
Organization:
IPC - Association Connecting Electronics Industries
Year: 2004
Abstract: This infrared spectrophotometric analysis test method is for use in identifying the nature of nonionic organic contaminants present on printed wiring board surfaces or on the contaminated microscope slide used in the solvent extraction procedure defined in IPC-TM-650, Test Method 2.3.38, by use of the Multiple Internal Reflectance (MIR) Method. This test should be performed only by an experienced spectroscopist.
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IPC TM-650 2.3.39C
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| contributor author | IPC - Association Connecting Electronics Industries | |
| date accessioned | 2017-09-04T18:42:30Z | |
| date available | 2017-09-04T18:42:30Z | |
| date copyright | 05/01/2004 | |
| date issued | 2004 | |
| identifier other | JZOHFBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsery=autho162s7D83081DAC426159DD6EFDEC014A/handle/yse/223931 | |
| description abstract | This infrared spectrophotometric analysis test method is for use in identifying the nature of nonionic organic contaminants present on printed wiring board surfaces or on the contaminated microscope slide used in the solvent extraction procedure defined in IPC-TM-650, Test Method 2.3.38, by use of the Multiple Internal Reflectance (MIR) Method. This test should be performed only by an experienced spectroscopist. | |
| language | English | |
| title | IPC TM-650 2.3.39C | num |
| title | Surface Organic Contaminant Identification Test (Infrared Analytical Method) | en |
| type | standard | |
| page | 4 | |
| status | Active | |
| tree | IPC - Association Connecting Electronics Industries:;2004 | |
| contenttype | fulltext |