درباره ما
GSFC-S-311-581
SCREENING PROCEDURE FOR DIODE, SILICON PHOTODETECTOR PART NO. S-1227-33BQ HAMAMATSU CORPORATION
Year: 1988
Show full item record
| contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
| date accessioned | 2017-09-04T17:39:10Z | |
| date available | 2017-09-04T17:39:10Z | |
| date copyright | 09/29/1988 | |
| date issued | 1988 | |
| identifier other | DRSZDAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsery=autho47037D83FCDCAC426159DD6EFDEC9FCD/handle/yse/162081 | |
| language | English | |
| title | GSFC-S-311-581 | num |
| title | SCREENING PROCEDURE FOR DIODE, SILICON PHOTODETECTOR PART NO. S-1227-33BQ HAMAMATSU CORPORATION | en |
| type | standard | |
| page | 5 | |
| status | Active | |
| tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1988 | |
| contenttype | fulltext |