IPC TM-650 2.1.1.2A
Microsectioning-Semi or Automatic Technique Microsection Equipment (Alternate)
Organization:
IPC - Association Connecting Electronics Industries
Year: 2004
Abstract: This procedure is an alternate method for preparing multiple metallographic specimen(s) using microsection equipment. The specimen(s) is(are) for evaluation for quality of the laminate system, plated-through holes (PTHs), the copper foils, platings, and/or coatings. The same basic procedure may be used for examination of other areas on the product.
Note: This microsection technique is a process and not a test method.
Note: SAFETY The use of the materials listed in Section 4 may be limited or forbidden in some environments. Please review the Material Safety Data Sheet (MSDS) for the materials being used.
Note: This microsection technique is a process and not a test method.
Note: SAFETY The use of the materials listed in Section 4 may be limited or forbidden in some environments. Please review the Material Safety Data Sheet (MSDS) for the materials being used.
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IPC TM-650 2.1.1.2A
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contributor author | IPC - Association Connecting Electronics Industries | |
date accessioned | 2017-09-04T17:12:29Z | |
date available | 2017-09-04T17:12:29Z | |
date copyright | 05/01/2004 | |
date issued | 2004 | |
identifier other | YVOHFBAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;jsery=authoF2376596FCDCAC426159DD6E273C9FCD/handle/yse/136005 | |
description abstract | This procedure is an alternate method for preparing multiple metallographic specimen(s) using microsection equipment. The specimen(s) is(are) for evaluation for quality of the laminate system, plated-through holes (PTHs), the copper foils, platings, and/or coatings. The same basic procedure may be used for examination of other areas on the product. Note: This microsection technique is a process and not a test method. Note: SAFETY The use of the materials listed in Section 4 may be limited or forbidden in some environments. Please review the Material Safety Data Sheet (MSDS) for the materials being used. | |
language | English | |
title | IPC TM-650 2.1.1.2A | num |
title | Microsectioning-Semi or Automatic Technique Microsection Equipment (Alternate) | en |
type | standard | |
page | 5 | |
status | Active | |
tree | IPC - Association Connecting Electronics Industries:;2004 | |
contenttype | fulltext |