IPC TM-650 2.3.32D

Flux Induced Corrosion (Copper Mirror Method)

contributor author	IPC - Association Connecting Electronics Industries
date accessioned	2017-09-04T18:10:05Z
date available	2017-09-04T18:10:05Z
date copyright	06/01/2004
date issued	2004
identifier other	GWKGIBAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;jsery=authoF2376596FCDCAC426159DD6E273C9FCD/handle/yse/193123
description abstract	This test method is designed to determine the removal effect the flux has (if any) on the bright copper mirror film which has been vacuum deposited on clear glass.
language	English
title	IPC TM-650 2.3.32D	num
title	Flux Induced Corrosion (Copper Mirror Method)	en
type	standard
page	2
status	Active
tree	IPC - Association Connecting Electronics Industries:;2004
contenttype	fulltext