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IPC TM-650 2.3.32D
Flux Induced Corrosion (Copper Mirror Method)
Organization:
IPC - Association Connecting Electronics Industries
Year: 2004
Abstract: This test method is designed to determine the removal effect the flux has (if any) on the bright copper mirror film which has been vacuum deposited on clear glass.
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IPC TM-650 2.3.32D
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| contributor author | IPC - Association Connecting Electronics Industries | |
| date accessioned | 2017-09-04T18:10:05Z | |
| date available | 2017-09-04T18:10:05Z | |
| date copyright | 06/01/2004 | |
| date issued | 2004 | |
| identifier other | GWKGIBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsery=authoF2376596FCDCAC426159DD6E273C9FCD/handle/yse/193123 | |
| description abstract | This test method is designed to determine the removal effect the flux has (if any) on the bright copper mirror film which has been vacuum deposited on clear glass. | |
| language | English | |
| title | IPC TM-650 2.3.32D | num |
| title | Flux Induced Corrosion (Copper Mirror Method) | en |
| type | standard | |
| page | 2 | |
| status | Active | |
| tree | IPC - Association Connecting Electronics Industries:;2004 | |
| contenttype | fulltext |