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Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
24/30465997 DC
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BSI - British Standards Institution
Year: 2024
BSI - British Standards Institution
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Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
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| contributor author | BSI - British Standards Institution | |
| date accessioned | 2024-12-17T07:07:04Z | |
| date available | 2024-12-17T07:07:04Z | |
| date copyright | 23 January 2024 | |
| date issued | 2024 | |
| identifier isbn | - | |
| identifier other | 000000000030465997.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jse/handle/yse/336156 | |
| language | English | |
| publisher | BSI - British Standards Institution | |
| title | Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary | en |
| title | 24/30465997 DC | num |
| type | Standard | |
| page | 34 | |
| status | Current, Draft for public comment | |
| tree | BSI - British Standards Institution:;2024 | |
| contenttype | Fulltext |