درباره ما
BSI BS EN 60747-5-3
English -- Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods - AMD 13434: January 8, 2002; AMD 14084: January 20, 2003; Remains Current;
French -- Dispositifs discrets a semiconducteurs et circuits integres. Dispositifs optoelectroniques. Methodes de mesure - AMD 13434: January 8, 2002; AMD 14084: January 20, 2003; Remains Current<br>German -- Einzel-Halbleiterbauelemente und integrierte Schaltungen. Optoelektronische Bauelemente. Messverfahren - AMD 13434: January 8, 2002; AMD 14084: January 20, 2003; Remains Current
Organization:
BSI - British Standards Institution
Year: 1998
Abstract: To be read in conjunction with IEC 60747-1,IEC 62007-1,IEC 62007-2
Subject: Electronic equipment and components
Collections
:
-
Statistics
BSI BS EN 60747-5-3
Show full item record
| contributor author | BSI - British Standards Institution | |
| date accessioned | 2017-09-04T17:06:52Z | |
| date available | 2017-09-04T17:06:52Z | |
| date copyright | 1998.01.15 | |
| date issued | 1998 | |
| identifier other | YGFOBBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessioutho1513AF67081D2068/handle/yse/130399 | |
| description abstract | To be read in conjunction with IEC 60747-1,IEC 62007-1,IEC 62007-2 | |
| language | English | |
| title | BSI BS EN 60747-5-3 | num |
| title | English -- Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods - AMD 13434: January 8, 2002; AMD 14084: January 20, 2003; Remains Current | en |
| title | French -- Dispositifs discrets a semiconducteurs et circuits integres. Dispositifs optoelectroniques. Methodes de mesure - AMD 13434: January 8, 2002; AMD 14084: January 20, 2003; Remains Current German -- Einzel-Halbleiterbauelemente und integrierte Schaltungen. Optoelektronische Bauelemente. Messverfahren - AMD 13434: January 8, 2002; AMD 14084: January 20, 2003; Remains Current | other |
| type | standard | |
| page | 48 | |
| status | Active | |
| tree | BSI - British Standards Institution:;1998 | |
| contenttype | fulltext | |
| subject keywords | Electronic equipment and components | |
| subject keywords | Emission | |
| subject keywords | Integrated circuits | |
| subject keywords | Intensity | |
| subject keywords | Light emission | |
| subject keywords | Light-emitting devices | |
| subject keywords | Light-sensitized materials | |
| subject keywords | Luminosity | |
| subject keywords | Measuring instruments | |
| subject keywords | Optoelectronic devices | |
| subject keywords | Photometers | |
| subject keywords | Phototransistors | |
| subject keywords | Radiation | |
| subject keywords | Semiconductor devices | |
| subject keywords | Voltage |
Related items
Showing items related by title, author, creator and subject.
-
BSI BS SP 114 + A5
Type: standardSource: BSI - British Standards Institution:;2006Organization : BSI - British Standards Institution -
BSI BS ISO/IEC 18013-3 + A1
Type: standardSource: BSI - British Standards Institution:;2009Organization : BSI - British Standards Institution -
BSI BS 857
Type: standardSource: BSI - British Standards Institution:;2012Organization : BSI - British Standards InstitutionAbstract: Requirements, tests for flat and curved toughened (heat treated or chemically toughened) and laminated safety glass, thickness 2 mm to 13 mm. Optical requirements for windscreens. Sampling, uniformity and fragmentation ...