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GSFC-S-311-372
SCREENING PROCEDURE FOR MICROCIRCUIT, HIGH TEMPERATURE SAMPLE AND MOLD AMPLIFIER PART NO. HA-1-2420-8
Year: 1984
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| contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
| date accessioned | 2017-09-04T17:08:37Z | |
| date available | 2017-09-04T17:08:37Z | |
| date copyright | 31045 | |
| date issued | 1984 | |
| identifier other | YKSZDAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessioutho4/handle/yse/132094 | |
| language | English | |
| title | GSFC-S-311-372 | num |
| title | SCREENING PROCEDURE FOR MICROCIRCUIT, HIGH TEMPERATURE SAMPLE AND MOLD AMPLIFIER PART NO. HA-1-2420-8 | en |
| type | standard | |
| page | 7 | |
| status | Active | |
| tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1984 | |
| contenttype | fulltext |