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IEC 61671-5
English -- Standard for automatic test markup language (ATML) test adapter description - Edition 1.0
Organization:
IEC - International Electrotechnical Commission
Year: 2016
Abstract: Scope: This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.
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| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2017-10-18T11:11:05Z | |
| date available | 2017-10-18T11:11:05Z | |
| date copyright | 2016.04.01 | |
| date issued | 2016 | |
| identifier other | YOGVOFAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/236126 | |
| description abstract | Scope: This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information. | |
| language | English | |
| title | IEC 61671-5 | num |
| title | English -- Standard for automatic test markup language (ATML) test adapter description - Edition 1.0 | en |
| type | standard | |
| page | 32 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2016 | |
| contenttype | fulltext |