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IEC 60749-26
|French -- Dispositifs à semiconducteurs – Méthodes d'essais mécaniques et climatiques – Partie 26: Essai de sensibilité aux décharges électrostatiques (DES) – Modèle du corps humain (HBM) - Edition 4.0Semiconductor devices – Mechanical and climatic test
Organization:
IEC - International Electrotechnical Commission
Year: 2018
Abstract: This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected.
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| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2018-07-31T09:57:54Z | |
| date available | 2018-07-31T09:57:54Z | |
| date copyright | 2018.01.01 | |
| date issued | 2018 | |
| identifier other | EGHYCGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/264258 | |
| description abstract | This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected. | |
| language | English | |
| language | French | |
| title | IEC 60749-26 | num |
| title | |French -- Dispositifs à semiconducteurs – Méthodes d'essais mécaniques et climatiques – Partie 26: Essai de sensibilité aux décharges électrostatiques (DES) – Modèle du corps humain (HBM) - Edition 4.0Semiconductor devices – Mechanical and climatic test | en |
| type | standard | |
| page | 110 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2018 | |
| contenttype | fulltext |