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IEC TR 61340-5-2 (REDLINE + STANDARD)
Electrostatics – Part 5-2: Protection of electronic devices from electrostatic phenomena – User guide - Edition 2.0
Organization:
IEC - International Electrotechnical Commission
Year: 2018
Abstract: This part of IEC 61340, which has been developed to support IEC 61340-5-1, applies to activities that: manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts, assemblies and equipment with withstand voltages greater than or equal to 100 V HBM, 200 V CDM and 35 V for isolated conductors. Additional control elements or adjusted limits can be applicable for ESDS with lower withstand voltages. NOTE Isolated conductors were historically represented by MM.
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IEC TR 61340-5-2 (REDLINE + STANDARD)
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| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2018-07-31T09:57:54Z | |
| date available | 2018-07-31T09:57:54Z | |
| date copyright | 2018.03.01 | |
| date issued | 2018 | |
| identifier other | EMZXEGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/264266 | |
| description abstract | This part of IEC 61340, which has been developed to support IEC 61340-5-1, applies to activities that: manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts, assemblies and equipment with withstand voltages greater than or equal to 100 V HBM, 200 V CDM and 35 V for isolated conductors. Additional control elements or adjusted limits can be applicable for ESDS with lower withstand voltages. NOTE Isolated conductors were historically represented by MM. | |
| language | English | |
| title | IEC TR 61340-5-2 (REDLINE + STANDARD) | num |
| title | Electrostatics – Part 5-2: Protection of electronic devices from electrostatic phenomena – User guide - Edition 2.0 | en |
| type | standard | |
| page | 200 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2018 | |
| contenttype | fulltext |