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IEC 62969-4
|French -- Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 4: Méthode d’évaluation de l’interface de données destinée aux capteurs de véhicules automobiles - Edition 1.0Semiconductor devices - Semiconduc
Organization:
IEC - International Electrotechnical Commission
Year: 2018
Abstract: This part of IEC 62969 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface
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| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2018-07-31T09:58:11Z | |
| date available | 2018-07-31T09:58:11Z | |
| date copyright | 2018.06.01 | |
| date issued | 2018 | |
| identifier other | KDUZFGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;jsessiouthor:%22NAVY%20-%20YD%20-/handle/yse/264445 | |
| description abstract | This part of IEC 62969 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface | |
| language | English | |
| language | French | |
| title | IEC 62969-4 | num |
| title | |French -- Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 4: Méthode d’évaluation de l’interface de données destinée aux capteurs de véhicules automobiles - Edition 1.0Semiconductor devices - Semiconduc | en |
| type | standard | |
| page | 44 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2018 | |
| contenttype | fulltext |