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JEDEC JESD89A
Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
Organization:
JEDEC - Solid State Technology Association
Year: 2006
Abstract: This specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and acceleratedtesting procedures are described. At terrestrial, Earth-based altitudes, the predominant sources of radiation include both cosmic-ray radiation and alpha-particle radiation from radioisotopic impurities in the package and chip materials. An overall assessment of a deviceÂ's SER is complete, only when an unaccelerated test is done, or accelerated SER data for the alpha-particle component and the cosmic-radiation component has been obtained.
Subject: Alpha Particles
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T16:55:44Z | |
| date available | 2017-09-04T16:55:44Z | |
| date copyright | 38991 | |
| date issued | 2006 | |
| identifier other | XCATJBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/119187 | |
| description abstract | This specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and acceleratedtesting procedures are described. At terrestrial, Earth-based altitudes, the predominant sources of radiation include both cosmic-ray radiation and alpha-particle radiation from radioisotopic impurities in the package and chip materials. An overall assessment of a deviceÂ's SER is complete, only when an unaccelerated test is done, or accelerated SER data for the alpha-particle component and the cosmic-radiation component has been obtained. | |
| language | English | |
| title | JEDEC JESD89A | num |
| title | Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices | en |
| type | standard | |
| page | 94 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2006 | |
| contenttype | fulltext | |
| subject keywords | Alpha Particles | |
| subject keywords | Cosmic Rays | |
| subject keywords | Soft Error Rate | |
| subject keywords | Terrestrial |