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JEDEC JESD22-A110D
Highly Accelerated Temperature and Humidity Stress Test (HAST)
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T17:10:41Z | |
| date available | 2017-09-04T17:10:41Z | |
| date copyright | 40483 | |
| date issued | 2010 | |
| identifier other | YQKSEDAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/134240 | |
| description abstract | The Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. The stress usually activates the same failure mechanisms as the "85/85" Steady-State Humidity Life Test (JEDEC Standard No. 22-A101). | |
| language | English | |
| title | JEDEC JESD22-A110D | num |
| title | Highly Accelerated Temperature and Humidity Stress Test (HAST) | en |
| type | standard | |
| page | 14 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2010 | |
| contenttype | fulltext |
