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JEDEC JESD22-A110D

Highly Accelerated Temperature and Humidity Stress Test (HAST)

Organization:
JEDEC - Solid State Technology Association
Year: 2010

Abstract: The Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. The stress usually activates the same failure mechanisms as the "85/85" Steady-State Humidity Life Test (JEDEC Standard No. 22-A101).
URI: http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/134240
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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T17:10:41Z
date available2017-09-04T17:10:41Z
date copyright40483
date issued2010
identifier otherYQKSEDAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/134240
description abstractThe Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. The stress usually activates the same failure mechanisms as the "85/85" Steady-State Humidity Life Test (JEDEC Standard No. 22-A101).
languageEnglish
titleJEDEC JESD22-A110Dnum
titleHighly Accelerated Temperature and Humidity Stress Test (HAST)en
typestandard
page14
statusActive
treeJEDEC - Solid State Technology Association:;2010
contenttypefulltext
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