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JEDEC JEP121A
Requirements for Microelectronic Screening and Test Optimization
Organization:
JEDEC - Solid State Technology Association
Year: 2006
Abstract: The purpose of this document provides the basis for the optimization of 100{}creening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.
Subject: MIL-STD-883
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T17:11:33Z | |
| date available | 2017-09-04T17:11:33Z | |
| date copyright | 38991 | |
| date issued | 2006 | |
| identifier other | YSWSJBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/135088 | |
| description abstract | The purpose of this document provides the basis for the optimization of 100{}creening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs. | |
| language | English | |
| title | JEDEC JEP121A | num |
| title | Requirements for Microelectronic Screening and Test Optimization | en |
| type | standard | |
| page | 36 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2006 | |
| contenttype | fulltext | |
| subject keywords | MIL-STD-883 | |
| subject keywords | Optimization | |
| subject keywords | QCI Optimization | |
| subject keywords | Screening |