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JEDEC JESD89-3A

Test Method for Beam Accelerated Soft Error Rate - Addendum No. 3 to JESD89

Organization:
JEDEC - Solid State Technology Association
Year: 2007

Abstract: This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.
URI: http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/141545
Subject: Accelerated
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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T17:18:13Z
date available2017-09-04T17:18:13Z
date copyright39387
date issued2007
identifier otherCBZGBCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/141545
description abstractThis test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.
languageEnglish
titleJEDEC JESD89-3Anum
titleTest Method for Beam Accelerated Soft Error Rate - Addendum No. 3 to JESD89en
typestandard
page28
statusActive
treeJEDEC - Solid State Technology Association:;2007
contenttypefulltext
subject keywordsAccelerated
subject keywordsBeam
subject keywordscosmic
subject keywordsneuton
subject keywordsproton
subject keywordsradiation
subject keywordsSER
subject keywordsSoft Error Rate
subject keywordsTest Method
subject keywordsTest Method - Beam Accelrated Soft Error Rate
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