JEDEC JESD203

Standard Test Loads For Dual - Supply Level Translation Devices

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T17:53:17Z
date available	2017-09-04T17:53:17Z
date copyright	38657
date issued	2005
identifier other	FEDPIBAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/176470
description abstract	This standard defines ac test loads for dual-supply level translation devices. Uniform test loads enable easy comparison of electrical parameters of dual-supply level translation devices across functions, logic families and IC suppliers. This standard is only intended to apply to devices released subsequent to the publication of this document.
language	English
title	JEDEC JESD203	num
title	Standard Test Loads For Dual - Supply Level Translation Devices	en
type	standard
page	10
status	Active
tree	JEDEC - Solid State Technology Association:;2005
contenttype	fulltext
subject keywords	Dual-Supply Volatage
subject keywords	Test Loads
subject keywords	Voltage Level Translation
subject keywords	Voltage Logic Levels