JEDEC JESD22-B102E
Solderability
Organization:
JEDEC - Solid State Technology Association
Year: 2007
Abstract: This test method provides optional conditions for preconditioning and soldering for the purpose of assessing the solderability of device package terminations. It provides procedures for dip & look solderability testing of through hole, axial and surface mount devices and a surface mount process simulation test for surface mount packages. The purpose of this test method is to provide a means of determining the solderability of device package terminations that are intended to be joined to another surface using lead (Pb) containing or Pb-free solder for the attachment.
Subject: Solderability Testing - Dip and Look
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JEDEC JESD22-B102E
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contributor author | JEDEC - Solid State Technology Association | |
date accessioned | 2017-09-04T15:47:13Z | |
date available | 2017-09-04T15:47:13Z | |
date copyright | 39356 | |
date issued | 2007 | |
identifier other | PXPCBCAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/50015 | |
description abstract | This test method provides optional conditions for preconditioning and soldering for the purpose of assessing the solderability of device package terminations. It provides procedures for dip & look solderability testing of through hole, axial and surface mount devices and a surface mount process simulation test for surface mount packages. The purpose of this test method is to provide a means of determining the solderability of device package terminations that are intended to be joined to another surface using lead (Pb) containing or Pb-free solder for the attachment. | |
language | English | |
title | JEDEC JESD22-B102E | num |
title | Solderability | en |
type | standard | |
page | 26 | |
status | Active | |
tree | JEDEC - Solid State Technology Association:;2007 | |
contenttype | fulltext | |
subject keywords | Solderability Testing - Dip and Look | |
subject keywords | Test Method - Solderability |