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JEDEC JESD22-B102E

Solderability

Organization:
JEDEC - Solid State Technology Association
Year: 2007

Abstract: This test method provides optional conditions for preconditioning and soldering for the purpose of assessing the solderability of device package terminations. It provides procedures for dip & look solderability testing of through hole, axial and surface mount devices and a surface mount process simulation test for surface mount packages. The purpose of this test method is to provide a means of determining the solderability of device package terminations that are intended to be joined to another surface using lead (Pb) containing or Pb-free solder for the attachment.
URI: http://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/50015
Subject: Solderability Testing - Dip and Look
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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T15:47:13Z
date available2017-09-04T15:47:13Z
date copyright39356
date issued2007
identifier otherPXPCBCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;quein=autho123393FD081DAC4/handle/yse/50015
description abstractThis test method provides optional conditions for preconditioning and soldering for the purpose of assessing the solderability of device package terminations. It provides procedures for dip & look solderability testing of through hole, axial and surface mount devices and a surface mount process simulation test for surface mount packages. The purpose of this test method is to provide a means of determining the solderability of device package terminations that are intended to be joined to another surface using lead (Pb) containing or Pb-free solder for the attachment.
languageEnglish
titleJEDEC JESD22-B102Enum
titleSolderabilityen
typestandard
page26
statusActive
treeJEDEC - Solid State Technology Association:;2007
contenttypefulltext
subject keywordsSolderability Testing - Dip and Look
subject keywordsTest Method - Solderability
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