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JEDEC EIA-323
Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices
Organization:
JEDEC - Solid State Technology Association
Year: 2002
Abstract: This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.
Subject: Air Convection Cooled Life Test
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T17:35:54Z | |
| date available | 2017-09-04T17:35:54Z | |
| date copyright | 03/01/1966 (R 1972)(R 2002) | |
| date issued | 2002 | |
| identifier other | DJDICAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quein=autho162s936D081DAC4/handle/yse/158781 | |
| description abstract | This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device. | |
| language | English | |
| title | JEDEC EIA-323 | num |
| title | Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices | en |
| type | standard | |
| page | 6 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2002 | |
| contenttype | fulltext | |
| subject keywords | Air Convection Cooled Life Test | |
| subject keywords | Environment of Life Test for Lead-Mounted Devices | |
| subject keywords | Life Testing - Lead Mounted Semiconductor Devices |