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English -- Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors - Edition 1.0
IEC 60747-18-1
Organization:
IEC - International Electrotechnical Commission
Year: 2019
Abstract: Scope: This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
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English -- Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors - Edition 1.0
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| contributor author | IEC - International Electrotechnical Commission | |
| date accessioned | 2020-09-15T22:27:55Z | |
| date available | 2020-09-15T22:27:55Z | |
| date copyright | 2019.05.01 | |
| date issued | 2019 | |
| identifier other | LFDYHGAAAAAAAAAA.pdf | |
| identifier other | LFDYHGAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quein=autho162sAF6D081DAC4/handle/yse/288916 | |
| description abstract | Scope: This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports. | |
| language | English | |
| title | English -- Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors - Edition 1.0 | en |
| title | IEC 60747-18-1 | num |
| type | standard | |
| page | 30 | |
| status | Active | |
| tree | IEC - International Electrotechnical Commission:;2019 | |
| contenttype | fulltext |