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GSFC-S-311-214
SCREENING PROCEDURE FOR MICROCIRCUIT PART NO. OP-207AY/883 (OP-AMP, MATCHED, LOW VOS PIN DIP)
Year: 1983
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| contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
| date accessioned | 2017-09-04T18:29:08Z | |
| date available | 2017-09-04T18:29:08Z | |
| date copyright | 09/27/1983 | |
| date issued | 1983 | |
| identifier other | ISRZDAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quein=autho4703AF6DFCDCAC4/handle/yse/211353 | |
| language | English | |
| title | GSFC-S-311-214 | num |
| title | SCREENING PROCEDURE FOR MICROCIRCUIT PART NO. OP-207AY/883 (OP-AMP, MATCHED, LOW VOS PIN DIP) | en |
| type | standard | |
| page | 10 | |
| status | Active | |
| tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1983 | |
| contenttype | fulltext |