ECA EIA-970

Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

contributor author	ECIA - Electronic Components Industry Association
date accessioned	2017-09-04T15:58:32Z
date available	2017-09-04T15:58:32Z
date copyright	07/01/2013
date issued	2013
identifier other	RCWYFFAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=anid=47037D83081DAC4218546D6E273C9FCD/handle/yse/61658
description abstract	This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.
language	English
title	ECA EIA-970	num
title	Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors	en
type	standard
page	26
status	Active
tree	ECIA - Electronic Components Industry Association:;2013
contenttype	fulltext