ECA EIA-970
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
Organization:
ECIA - Electronic Components Industry Association
Year: 2013
Abstract: This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.
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contributor author | ECIA - Electronic Components Industry Association | |
date accessioned | 2017-09-04T15:58:32Z | |
date available | 2017-09-04T15:58:32Z | |
date copyright | 07/01/2013 | |
date issued | 2013 | |
identifier other | RCWYFFAAAAAAAAAA.pdf | |
identifier uri | http://yse.yabesh.ir/std;query=anid=47037D83081DAC4218546D6E273C9FCD/handle/yse/61658 | |
description abstract | This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture. | |
language | English | |
title | ECA EIA-970 | num |
title | Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors | en |
type | standard | |
page | 26 | |
status | Active | |
tree | ECIA - Electronic Components Industry Association:;2013 | |
contenttype | fulltext |