• 0
    • ارسال درخواست
    • حذف همه
    • Industrial Standards
    • Defence Standards
  • درباره ما
  • درخواست موردی
  • فهرست استانداردها
    • Industrial Standards
    • Defence Standards
  • راهنما
  • Login
  • لیست خرید شما 0
    • ارسال درخواست
    • حذف همه
View Item 
  •   YSE
  • Industrial Standards
  • BSI - British Standards Institution
  • View Item
  •   YSE
  • Industrial Standards
  • BSI - British Standards Institution
  • View Item
  • All Fields
  • Title(or Doc Num)
  • Organization
  • Year
  • Subject
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

Archive

BSI BS IEC 60748-2-20

English -- Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits;
French -- Dispositifs a semiconducteurs. Circuits integres. Circuits integres numeriques. Specification de famille. Circuits integres basse tension<br>German -- Halbleiterbauelemente. Integrierte Schaltungen. Integrierte Digitalschaltungen. Familienspezifikation. Integrierte Schaltungen fuer niedrige Spannungen

Organization:
BSI - British Standards Institution
Year: 2008

URI: http://yse.yabesh.ir/std;query=autho15137D83081DAC4261598F1EFDEC9FCD/handle/yse/45628
Subject: Digital integrated circuits
Collections :
  • BSI - British Standards Institution
  • Download PDF : (1.184Mb)
  • Show Full MetaData Hide Full MetaData
  • Statistics

    BSI BS IEC 60748-2-20

Show full item record

contributor authorBSI - British Standards Institution
date accessioned2017-09-04T15:43:22Z
date available2017-09-04T15:43:22Z
date copyright2008.09.30
date issued2008
identifier otherPLWGHCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho15137D83081DAC4261598F1EFDEC9FCD/handle/yse/45628
languageEnglish
titleBSI BS IEC 60748-2-20num
titleEnglish -- Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuitsen
titleFrench -- Dispositifs a semiconducteurs. Circuits integres. Circuits integres numeriques. Specification de famille. Circuits integres basse tension
German -- Halbleiterbauelemente. Integrierte Schaltungen. Integrierte Digitalschaltungen. Familienspezifikation. Integrierte Schaltungen fuer niedrige Spannungen
other
typestandard
page22
statusActive
treeBSI - British Standards Institution:;2008
contenttypefulltext
subject keywordsDigital integrated circuits
subject keywordsDirect current
subject keywordsElectrical components
subject keywordsElectrical equipment
subject keywordsElectronic equipment and components
subject keywordsIntegrated circuits
subject keywordsLow voltage
subject keywordsSemiconductor devices

Related items

Showing items related by title, author, creator and subject.

  • BSI BS QC 790101 

    Type: standard
    Source: BSI - British Standards Institution:;1992
    Organization : BSI - British Standards Institution
    Abstract: Tests to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
    Subject(s) : Approval testing , Assessed quality , Defects , Electronic equipment and components , Inspection , Integrated circuits , Internal , Qualification approval , Quality assurance systems , Semiconductor devices , Semiconductor resistors , Specification (approval) , Testing conditions , Visual inspection (testing) ,
    Request PDF
  • BSI BS QC 760200 

    Type: standard
    Source: BSI - British Standards Institution:;1997
    Organization : BSI - British Standards Institution
    Abstract: To be read in conjunction with BS QC 760000:1990
    Subject(s) : Acceptance inspection , Approval testing , Assessed quality , Capability approval , Circuits , Classification systems , Damp-heat tests , Data layout , Detail specification , Dimensions , Electrical testing , Electronic equipment and components , Environmental testing , Flow charts , Hybrid integrated circuits , Inspection , Integrated circuits , Integrated film circuits , Maintenance , Mass , Mechanical testing , Packaging , Qualification approval , Quality assurance systems , Quality control , Ratings , Sampling methods , Semiconductor devices , Solderability testing , Specification (approval) , Statistical quality control , Testing conditions ,
    Request PDF
  • BSI BS EN 165000-3 

    Type: standard
    Source: BSI - British Standards Institution:;2005
    Organization : BSI - British Standards Institution
    Subject(s) : Approval testing , Assessed quality , Capability approval , Declarations , Electronic equipment and components , Handbooks , Hybrid integrated circuits , Integrated circuits , Integrated film circuits , Log sheets , Quality assurance , Quality assurance systems , Quality auditing , Quality control , Reports , Technical documents ,
    Request PDF
DSpace software copyright © 2017-2020  DuraSpace
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
yabeshDSpacePersian
 
DSpace software copyright © 2017-2020  DuraSpace
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
yabeshDSpacePersian