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IPC TM-650 1.1C

Introduction

Organization:
IPC - Association Connecting Electronics Industries
Year: 2003

Abstract: Introduction
This manual establishes uniform methods for testing electronic and electrical parts including basic environmental, physical and electrical tests. These tests were developed to support IPC standards and specifications.
The tests described herein are not to be interpreted as an exact and conclusive representation of actual service opera-tion in any one geographic location, since it is known that the only true test for operation in a specific location is an actual service test at that point. The specified test conditions for a test method are those, which are obtainable in the laboratory and result in reproducible results.
No attempt has been made to include pass/fail criteria in the test methods. This information is found in the individual speci-fications and standards that reference the specific test method.
URI: http://yse.yabesh.ir/std;query=autho18267D83FCDCAC6/handle/yse/105976
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    IPC TM-650 1.1C

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contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T16:42:43Z
date available2017-09-04T16:42:43Z
date copyright01/01/2003
date issued2003
identifier otherVSKGIBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho18267D83FCDCAC6/handle/yse/105976
description abstractIntroduction
This manual establishes uniform methods for testing electronic and electrical parts including basic environmental, physical and electrical tests. These tests were developed to support IPC standards and specifications.
The tests described herein are not to be interpreted as an exact and conclusive representation of actual service opera-tion in any one geographic location, since it is known that the only true test for operation in a specific location is an actual service test at that point. The specified test conditions for a test method are those, which are obtainable in the laboratory and result in reproducible results.
No attempt has been made to include pass/fail criteria in the test methods. This information is found in the individual speci-fications and standards that reference the specific test method.
languageEnglish
titleIPC TM-650 1.1Cnum
titleIntroductionen
typestandard
page1
statusActive
treeIPC - Association Connecting Electronics Industries:;2003
contenttypefulltext
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