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IPC TM-650 2.2.16.1
Artwork Master Evaluation by Overlay
Organization:
IPC - Association Connecting Electronics Industries
Year: 1987
Abstract: This test method is used to evaluate 1:1 artwork masters for layer to layer registration, conductor to edge spacing, screened nomenclature positioning, and solder mask to conductor relationships.
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IPC TM-650 2.2.16.1
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| contributor author | IPC - Association Connecting Electronics Industries | |
| date accessioned | 2017-09-04T18:10:28Z | |
| date available | 2017-09-04T18:10:28Z | |
| date copyright | 32112 | |
| date issued | 1987 | |
| identifier other | GXLADAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho18267D83FCDCAC6/handle/yse/193514 | |
| description abstract | This test method is used to evaluate 1:1 artwork masters for layer to layer registration, conductor to edge spacing, screened nomenclature positioning, and solder mask to conductor relationships. | |
| language | English | |
| title | IPC TM-650 2.2.16.1 | num |
| title | Artwork Master Evaluation by Overlay | en |
| type | standard | |
| page | 1 | |
| status | Active | |
| tree | IPC - Association Connecting Electronics Industries:;1987 | |
| contenttype | fulltext |