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IPC TM-650 2.5.33.4

Measurement of Electrical Overstress from Soldering Hand Tools - Shielded Enclosure

Organization:
IPC - Association Connecting Electronics Industries
Year: 1998

Abstract: The following information is a supporting document in support of Method 2.5.33. The test methods within this group of procedures can be falsely influenced by radio frequency interference and electromagnetic interference from lighting and equipment found in the workplace and testing area. To avoid these influences, the leakage and transient tests should be performed in a screen room. In lieu of a screen room, this test method has been provided to make a low cost shielded enclosure, which should provide adequate shielding for the performance of these test procedures.
URI: http://yse.yabesh.ir/std;query=autho18267D83FCDCAC6/handle/yse/96029
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    IPC TM-650 2.5.33.4

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contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T16:32:33Z
date available2017-09-04T16:32:33Z
date copyright36100
date issued1998
identifier otherURWXHAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho18267D83FCDCAC6/handle/yse/96029
description abstractThe following information is a supporting document in support of Method 2.5.33. The test methods within this group of procedures can be falsely influenced by radio frequency interference and electromagnetic interference from lighting and equipment found in the workplace and testing area. To avoid these influences, the leakage and transient tests should be performed in a screen room. In lieu of a screen room, this test method has been provided to make a low cost shielded enclosure, which should provide adequate shielding for the performance of these test procedures.
languageEnglish
titleIPC TM-650 2.5.33.4num
titleMeasurement of Electrical Overstress from Soldering Hand Tools - Shielded Enclosureen
typestandard
page3
statusActive
treeIPC - Association Connecting Electronics Industries:;1998
contenttypefulltext
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