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IPC TM-650 2.5.19.1A
Propagation Delay of Flat Cables Using Dual Trace Oscilloscope
Organization:
IPC - Association Connecting Electronics Industries
Year: 1984
Abstract: This test method describes the test procedures required to measure propagation delay in flat cables. This test method is an alternative to IPC-TM-650, Method 2.5.19. Propagation delay is defined as the time required for a pulse to traverse a unit length of cable. Excessive propagation delay will result in the malfunction of critical circuits due to the late arrival of pulses. Propagation delay is directly proportional to the effective dielectric constant of the insulation.
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IPC TM-650 2.5.19.1A
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| contributor author | IPC - Association Connecting Electronics Industries | |
| date accessioned | 2017-09-04T16:34:42Z | |
| date available | 2017-09-04T16:34:42Z | |
| date copyright | 07/01/1984 | |
| date issued | 1984 | |
| identifier other | UYAADAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho18267D83FCDCAC6/handle/yse/98191 | |
| description abstract | This test method describes the test procedures required to measure propagation delay in flat cables. This test method is an alternative to IPC-TM-650, Method 2.5.19. Propagation delay is defined as the time required for a pulse to traverse a unit length of cable. Excessive propagation delay will result in the malfunction of critical circuits due to the late arrival of pulses. Propagation delay is directly proportional to the effective dielectric constant of the insulation. | |
| language | English | |
| title | IPC TM-650 2.5.19.1A | num |
| title | Propagation Delay of Flat Cables Using Dual Trace Oscilloscope | en |
| type | standard | |
| page | 4 | |
| status | Active | |
| tree | IPC - Association Connecting Electronics Industries:;1984 | |
| contenttype | fulltext |