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JEDEC JESD6
Measurement of Small Values of Transistor Capacitance
Organization:
JEDEC - Solid State Technology Association
Year: 2002
Abstract: This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
Subject: Capacitance - Transistor
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T15:13:27Z | |
| date available | 2017-09-04T15:13:27Z | |
| date copyright | 02/01/1967 (R 1981)(R 1999)(R 2002) | |
| date issued | 2002 | |
| identifier other | MAJBKBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/12160 | |
| description abstract | This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance. | |
| language | English | |
| title | JEDEC JESD6 | num |
| title | Measurement of Small Values of Transistor Capacitance | en |
| type | standard | |
| page | 17 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2002 | |
| contenttype | fulltext | |
| subject keywords | Capacitance - Transistor | |
| subject keywords | Measurement - Small Value Transistor Capacitance | |
| subject keywords | Small Values - Transistor Capacitance | |
| subject keywords | Transistor - Capacitance |