JEDEC JEP138

User Guidelines for IR Thermal Imaging Determination of Die Temperature

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T15:23:32Z
date available	2017-09-04T15:23:32Z
date copyright	09/01/1999
date issued	1999
identifier other	NFNIJAAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/23801
description abstract	The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.
language	English
title	JEDEC JEP138	num
title	User Guidelines for IR Thermal Imaging Determination of Die Temperature	en
type	standard
page	10
status	Active
tree	JEDEC - Solid State Technology Association:;1999
contenttype	fulltext
subject keywords	Die Temperature
subject keywords	IR - Infrared
subject keywords	IR Thermal Imaging