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JEDEC JEP138
User Guidelines for IR Thermal Imaging Determination of Die Temperature
Organization:
JEDEC - Solid State Technology Association
Year: 1999
Abstract: The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.
Subject: Die Temperature
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T15:23:32Z | |
| date available | 2017-09-04T15:23:32Z | |
| date copyright | 09/01/1999 | |
| date issued | 1999 | |
| identifier other | NFNIJAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/23801 | |
| description abstract | The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance. | |
| language | English | |
| title | JEDEC JEP138 | num |
| title | User Guidelines for IR Thermal Imaging Determination of Die Temperature | en |
| type | standard | |
| page | 10 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;1999 | |
| contenttype | fulltext | |
| subject keywords | Die Temperature | |
| subject keywords | IR - Infrared | |
| subject keywords | IR Thermal Imaging |