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JEDEC JESD51-7

High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages

Organization:
JEDEC - Solid State Technology Association
Year: 1999

Abstract: This fixturing further defines the environment for thermal test of packaged microelectronic devices. Its function is to provide an alternate mounting surface for the analysis of heat flow in electronic components. The objective of the standard is to provide a high effective thermal conductivity mounting surface that can be compared equally against standard tests done in different laboratories with typical variations of less than or equal to 10%.
URI: http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/39614
Subject: Analysis - Heat Flow
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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T15:37:42Z
date available2017-09-04T15:37:42Z
date copyright02/01/1999
date issued1999
identifier otherOVTXHAAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/39614
description abstractThis fixturing further defines the environment for thermal test of packaged microelectronic devices. Its function is to provide an alternate mounting surface for the analysis of heat flow in electronic components. The objective of the standard is to provide a high effective thermal conductivity mounting surface that can be compared equally against standard tests done in different laboratories with typical variations of less than or equal to 10%.
languageEnglish
titleJEDEC JESD51-7num
titleHigh Effective Thermal Conductivity Test Board for Leaded Surface Mount Packagesen
typestandard
page13
statusActive
treeJEDEC - Solid State Technology Association:;1999
contenttypefulltext
subject keywordsAnalysis - Heat Flow
subject keywordsTest Board - Leaded Surface Mount
subject keywordsThermal Conductivity
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