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JEDEC JESD25
Measurement of Small-Signal Transistor Scattering Parameters
Organization:
JEDEC - Solid State Technology Association
Year: 2002
Abstract: This standard provides a test method and definition for small-signal conditions at microwave frequencies.
Subject: Measurement - Scattering Parameters
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T15:52:03Z | |
| date available | 2017-09-04T15:52:03Z | |
| date copyright | 11/01/1972 (R 1981)(R 2000)(R 2002) | |
| date issued | 2002 | |
| identifier other | QLTZJBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/55306 | |
| description abstract | This standard provides a test method and definition for small-signal conditions at microwave frequencies. | |
| language | English | |
| title | JEDEC JESD25 | num |
| title | Measurement of Small-Signal Transistor Scattering Parameters | en |
| type | standard | |
| page | 32 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2002 | |
| contenttype | fulltext | |
| subject keywords | Measurement - Scattering Parameters | |
| subject keywords | Scattering Parameters | |
| subject keywords | Small Signal Transistors |