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JEDEC JESD74A
Early Life Failure Rate Calculation Procedure for Semiconductor Components
| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T16:03:55Z | |
| date available | 2017-09-04T16:03:55Z | |
| date copyright | 02/01/2007 | |
| date issued | 2007 | |
| identifier other | RRXVYBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/67243 | |
| description abstract | This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers' requirements. | |
| language | English | |
| title | JEDEC JESD74A | num |
| title | Early Life Failure Rate Calculation Procedure for Semiconductor Components | en |
| type | standard | |
| page | 38 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2007 | |
| contenttype | fulltext | |
| subject keywords | Acceleration Factor | |
| subject keywords | Activation Energy | |
| subject keywords | Calculation - ELFR | |
| subject keywords | Early Life - Failure Rate Calculation | |
| subject keywords | Electronic Components | |
| subject keywords | ELFR - Early Life Failure Rate | |
| subject keywords | FIT |
