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JEDEC JESD74A

Early Life Failure Rate Calculation Procedure for Semiconductor Components

Organization:
JEDEC - Solid State Technology Association
Year: 2007

Abstract: This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers' requirements.
URI: http://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/67243
Subject: Acceleration Factor
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contributor authorJEDEC - Solid State Technology Association
date accessioned2017-09-04T16:03:55Z
date available2017-09-04T16:03:55Z
date copyright02/01/2007
date issued2007
identifier otherRRXVYBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho1826AF679D/handle/yse/67243
description abstractThis standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers' requirements.
languageEnglish
titleJEDEC JESD74Anum
titleEarly Life Failure Rate Calculation Procedure for Semiconductor Componentsen
typestandard
page38
statusActive
treeJEDEC - Solid State Technology Association:;2007
contenttypefulltext
subject keywordsAcceleration Factor
subject keywordsActivation Energy
subject keywordsCalculation - ELFR
subject keywordsEarly Life - Failure Rate Calculation
subject keywordsElectronic Components
subject keywordsELFR - Early Life Failure Rate
subject keywordsFIT
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