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MIL-PRF-55681F
CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
Organization:
ARMY - CR - US Army Communications Electronics Command
Year: 2004
Abstract: This specification covers the general requirements for non-established reliability (non-ER) and established reliability (ER), ceramic dielectric, multiple layer, chip capacitors. ER capacitors covered by this specification have failure rate levels (FRL) ranging from 1.0 percent to 0.001 percent per 1,000 hours. These FRLs are established at a 90-percent confidence level and maintained at a 10-percent producer's risk and are based on life tests performed at maximum rated voltage at maximum rated temperature. An acceleration factor of 8:1 has been used to relate life test data obtained at 200 percent of rated voltage at maximum rated temperature, to rated voltage at rated temperature. Intended Use: Ceramic chip capacitors are intended to be used in thin and thick film hybrid circuits where micro-circuitry is indicated for filter by-pass coupling applications, and where variation in capacitance with respect to temperature (−55°C to +125°C), voltage, frequency, and life can be tolerated. This specification also covers high frequency capacitors (CDR11 through CDR14 and CDR21 through CDR25) that are primarily intended for use in resonant circuits with high Q factor and stability of capacitance with respect to temperature (−55°C to +125°C), frequency, and life. These capacitors also offer established reliability that is verified under a qualification system. Commercial components are not designed to withstand these military environmental conditions.
Subject: Part per million (ppm)
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| contributor author | ARMY - CR - US Army Communications Electronics Command | |
| date accessioned | 2017-09-04T16:18:52Z | |
| date available | 2017-09-04T16:18:52Z | |
| date copyright | 09/03/2004 | |
| date issued | 2004 | |
| identifier other | TGQZFBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho47037D83FCDC49A/handle/yse/82321 | |
| description abstract | This specification covers the general requirements for non-established reliability (non-ER) and established reliability (ER), ceramic dielectric, multiple layer, chip capacitors. ER capacitors covered by this specification have failure rate levels (FRL) ranging from 1.0 percent to 0.001 percent per 1,000 hours. These FRLs are established at a 90-percent confidence level and maintained at a 10-percent producer's risk and are based on life tests performed at maximum rated voltage at maximum rated temperature. An acceleration factor of 8:1 has been used to relate life test data obtained at 200 percent of rated voltage at maximum rated temperature, to rated voltage at rated temperature. Intended Use: Ceramic chip capacitors are intended to be used in thin and thick film hybrid circuits where micro-circuitry is indicated for filter by-pass coupling applications, and where variation in capacitance with respect to temperature (−55°C to +125°C), voltage, frequency, and life can be tolerated. This specification also covers high frequency capacitors (CDR11 through CDR14 and CDR21 through CDR25) that are primarily intended for use in resonant circuits with high Q factor and stability of capacitance with respect to temperature (−55°C to +125°C), frequency, and life. These capacitors also offer established reliability that is verified under a qualification system. Commercial components are not designed to withstand these military environmental conditions. | |
| language | English | |
| title | MIL-PRF-55681F | num |
| title | CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR | en |
| type | standard | |
| page | 40 | |
| status | Active | |
| tree | ARMY - CR - US Army Communications Electronics Command:;2004 | |
| contenttype | fulltext | |
| subject keywords | Part per million (ppm) | |
| subject keywords | Statistical process control (SPC) |