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TIA TIA-455-106
FOTP 106 Procedures for Determining Threshold Current of Semiconductor Lasers - ANSI APPROVAL WITHDRAWN JUNE 2003
Organization:
TIA - Telecommunications Industry Association
Year: 1992
Abstract: This test covers the wavelength range from 600 nanometers to 1700 nanometers using a spectrophotometer capable of generating visible and near-infrared light. This method covers primary, secondary, and single coatings (e.g., acrylate, polyimide, and silicone), as well as pigmented coatings, that can be prepared in film specimens.
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TIA TIA-455-106
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| contributor author | TIA - Telecommunications Industry Association | |
| date accessioned | 2017-09-04T17:57:54Z | |
| date available | 2017-09-04T17:57:54Z | |
| date copyright | 33909 | |
| date issued | 1992 | |
| identifier other | FPZZIAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho47037D83FCDC49A961598F1EFDEC9FCD/handle/yse/180976 | |
| description abstract | This test covers the wavelength range from 600 nanometers to 1700 nanometers using a spectrophotometer capable of generating visible and near-infrared light. This method covers primary, secondary, and single coatings (e.g., acrylate, polyimide, and silicone), as well as pigmented coatings, that can be prepared in film specimens. | |
| language | English | |
| title | TIA TIA-455-106 | num |
| title | FOTP 106 Procedures for Determining Threshold Current of Semiconductor Lasers - ANSI APPROVAL WITHDRAWN JUNE 2003 | en |
| type | standard | |
| page | 23 | |
| status | Active | |
| tree | TIA - Telecommunications Industry Association:;1992 | |
| contenttype | fulltext |