TIA TIA-455-130

Elevated Temperature Life Test for Laser Diodes

contributor author	TIA - Telecommunications Industry Association
date accessioned	2017-09-04T18:23:58Z
date available	2017-09-04T18:23:58Z
date copyright	39387
date issued	2007
identifier other	IFMWBCAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho47037D83FCDC49A961598F1EFDEC9FCD/handle/yse/206389
description abstract	Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or current density is beyond the scope of this FOTP. This test is directed toward semiconductor laser diodes used in telecommunication applications for transmission or pumping purposes. Unless otherwise noted, this procedure applies to all semiconductor laser diodes that can be operated in a CW mode of operation; this includes pump lasers, direct and externally modulated lasers for both digital and analog applications. Also, this test is intended for sub-mounted (unpackaged) devices.
language	English
title	TIA TIA-455-130	num
title	Elevated Temperature Life Test for Laser Diodes	en
type	standard
page	18
status	Active
tree	TIA - Telecommunications Industry Association:;2007
contenttype	fulltext