• 0
    • ارسال درخواست
    • حذف همه
    • Industrial Standards
    • Defence Standards
  • درباره ما
  • درخواست موردی
  • فهرست استانداردها
    • Industrial Standards
    • Defence Standards
  • راهنما
  • Login
  • لیست خرید شما 0
    • ارسال درخواست
    • حذف همه
View Item 
  •   YSE
  • Industrial Standards
  • TIA - Telecommunications Industry Association
  • View Item
  •   YSE
  • Industrial Standards
  • TIA - Telecommunications Industry Association
  • View Item
  • All Fields
  • Title(or Doc Num)
  • Organization
  • Year
  • Subject
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

Archive

TIA TIA-455-130

Elevated Temperature Life Test for Laser Diodes

Organization:
TIA - Telecommunications Industry Association
Year: 2007

Abstract: Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or current density is beyond the scope of this FOTP. This test is directed toward semiconductor laser diodes used in telecommunication applications for transmission or pumping purposes. Unless otherwise noted, this procedure applies to all semiconductor laser diodes that can be operated in a CW mode of operation; this includes pump lasers, direct and externally modulated lasers for both digital and analog applications. Also, this test is intended for sub-mounted (unpackaged) devices.
URI: http://yse.yabesh.ir/std;query=autho47037D83FCDC49A961598F1EFDEC9FCD/handle/yse/206389
Collections :
  • TIA - Telecommunications Industry Association
  • Download PDF : (161.1Kb)
  • Show Full MetaData Hide Full MetaData
  • Statistics

    TIA TIA-455-130

Show full item record

contributor authorTIA - Telecommunications Industry Association
date accessioned2017-09-04T18:23:58Z
date available2017-09-04T18:23:58Z
date copyright39387
date issued2007
identifier otherIFMWBCAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho47037D83FCDC49A961598F1EFDEC9FCD/handle/yse/206389
description abstractAlthough the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or current density is beyond the scope of this FOTP. This test is directed toward semiconductor laser diodes used in telecommunication applications for transmission or pumping purposes. Unless otherwise noted, this procedure applies to all semiconductor laser diodes that can be operated in a CW mode of operation; this includes pump lasers, direct and externally modulated lasers for both digital and analog applications. Also, this test is intended for sub-mounted (unpackaged) devices.
languageEnglish
titleTIA TIA-455-130num
titleElevated Temperature Life Test for Laser Diodesen
typestandard
page18
statusActive
treeTIA - Telecommunications Industry Association:;2007
contenttypefulltext
DSpace software copyright © 2017-2020  DuraSpace
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
yabeshDSpacePersian
 
DSpace software copyright © 2017-2020  DuraSpace
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
yabeshDSpacePersian