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IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

IEEE Std 1658-2023 (Revision of IEEE Std 1658-2011)

Organization:
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Year: 2023

IEEE - The Institute of Electrical and Electronics Engineers, Inc.

Abstract: Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
URI: http://yse.yabesh.ir/std;query=autho47037D83FCDCAC4261598F1EFDEC014A/handle/yse/336265
Subject: spectrum
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    IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

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contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2024-12-17T08:08:41Z
date available2024-12-17T08:08:41Z
date copyright13 October 2023
date issued2023
identifier other10285677.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho47037D83FCDCAC4261598F1EFDEC014A/handle/yse/336265
description abstractTerminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
languageEnglish
publisherIEEE - The Institute of Electrical and Electronics Engineers, Inc.
titleIEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devicesen
titleIEEE Std 1658-2023 (Revision of IEEE Std 1658-2011)num
typestandard
page115
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2023
contenttypefulltext
subject keywordsspectrum
subject keywordstest methods
subject keywordsdigital-to-analog converter
subject keywordsDAC
subject keywordstest terminology
subject keywordsSFDR
subject keywordsIEEE 1658™
subject keywordsSNR
identifier DOI10.1109/IEEESTD.2023.10285677
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