IEEE Guide for Low-Frequency Dielectric Testing for Distribution, Power, and Regulating Transformers
IEEE Std C57.168-2023
Year: 2023
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Abstract: Provided in this guide for low frequency dielectric testing for distribution, power, and regulating transformers are background on various low frequency test methods as well as guidance on how to conduct and interpret the results. Common pitfalls to avoid are presented along with compiled guidance on interpreting the results and possible methods for correcting test issues.
Subject: dielectric frequency response
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IEEE Guide for Low-Frequency Dielectric Testing for Distribution, Power, and Regulating Transformers
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contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
date accessioned | 2024-12-17T08:08:46Z | |
date available | 2024-12-17T08:08:46Z | |
date copyright | 30 October 2023 | |
date issued | 2023 | |
identifier other | 10295425.pdf | |
identifier uri | http://yse.yabesh.ir/std;query=autho47037D83FCDCAC4261598F1EFDEC014A/handle/yse/336277 | |
description abstract | Provided in this guide for low frequency dielectric testing for distribution, power, and regulating transformers are background on various low frequency test methods as well as guidance on how to conduct and interpret the results. Common pitfalls to avoid are presented along with compiled guidance on interpreting the results and possible methods for correcting test issues. | |
language | English | |
publisher | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
title | IEEE Guide for Low-Frequency Dielectric Testing for Distribution, Power, and Regulating Transformers | en |
title | IEEE Std C57.168-2023 | num |
type | standard | |
page | 38 | |
status | Active | |
tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2023 | |
contenttype | fulltext | |
subject keywords | dielectric frequency response | |
subject keywords | applied | |
subject keywords | testing | |
subject keywords | transformer | |
subject keywords | dielectric test | |
subject keywords | troubleshooting | |
subject keywords | transformers | |
subject keywords | low-frequency test | |
subject keywords | hi-pot | |
subject keywords | IEEE C57.168 induced | |
subject keywords | over excitation | |
subject keywords | auto-transformer | |
subject keywords | insulation power factor | |
subject keywords | DFR | |
identifier DOI | 10.1109/IEEESTD.2023.10295425 |