ECA EIA/ECA-469-D

Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors

contributor author	ECIA - Electronic Components Industry Association
date accessioned	2017-09-04T17:34:51Z
date available	2017-09-04T17:34:51Z
date copyright	04/01/2006
date issued	2006
identifier other	DGJFJBAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;query=autho470393FD081D20686159DD6EFDEC9FCD0Facilities%20Engineering%20Command%226EFDEC9FCD/handle/yse/157728
description abstract	This document provides terminology, methods, and criteria for characterizing the internal structural features of monolithic, ceramic dielectric capacitors. Its major objective is the accurate evaluation of the internal physical quality of the chip capacitor element as it relates to the functional reliability of the finished capacitor. This Standard also provides needed and useful information pertaining to activities associated with destructive physical analysis (DPA), such as post-decapsulation visual inspection and DPA reporting. In addition, it provides tutorial help for problems inherent in DPA sample processing.
language	English
title	ECA EIA/ECA-469-D	num
title	Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors	en
type	standard
page	52
status	Active
tree	ECIA - Electronic Components Industry Association:;2006
contenttype	fulltext