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ECA EIA/ECA-469-D

Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors

Organization:
ECIA - Electronic Components Industry Association
Year: 2006

Abstract: This document provides terminology, methods, and criteria for characterizing the internal structural features of monolithic, ceramic dielectric capacitors. Its major objective is the accurate evaluation of the internal physical quality of the chip capacitor element as it relates to the functional reliability of the finished capacitor. This Standard also provides needed and useful information pertaining to activities associated with destructive physical analysis (DPA), such as post-decapsulation visual inspection and DPA reporting. In addition, it provides tutorial help for problems inherent in DPA sample processing.
URI: http://yse.yabesh.ir/std;query=autho470393FD081D20686159DD6EFDEC9FCD0Facilities%20Engineering%20Command%226EFDEC9FCD/handle/yse/157728
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    ECA EIA/ECA-469-D

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contributor authorECIA - Electronic Components Industry Association
date accessioned2017-09-04T17:34:51Z
date available2017-09-04T17:34:51Z
date copyright04/01/2006
date issued2006
identifier otherDGJFJBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=autho470393FD081D20686159DD6EFDEC9FCD0Facilities%20Engineering%20Command%226EFDEC9FCD/handle/yse/157728
description abstractThis document provides terminology, methods, and criteria for characterizing the internal structural features of monolithic, ceramic dielectric capacitors. Its major objective is the accurate evaluation of the internal physical quality of the chip capacitor element as it relates to the functional reliability of the finished capacitor. This Standard also provides needed and useful information pertaining to activities associated with destructive physical analysis (DPA), such as post-decapsulation visual inspection and DPA reporting. In addition, it provides tutorial help for problems inherent in DPA sample processing.
languageEnglish
titleECA EIA/ECA-469-Dnum
titleStandard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitorsen
typestandard
page52
statusActive
treeECIA - Electronic Components Industry Association:;2006
contenttypefulltext
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