درباره ما
ECA EIA-448-1B
Method 15 Standard Test Method for Electromechanical Switches (Test for Contact Bounce) - Addendum 1 to RS-448
Organization:
ECIA - Electronic Components Industry Association
Year: 1993
Abstract: PURPOSE
The purpose of this test method is to determine the duration of contact bounce so that it can be anticipated and provided for in user circuits. This phenomenon is defined as the random opening and closing of a switch contact that occurs after contact transfer caused by the switch mechanism. It is measured from the moment of first closure (or opening) to the moment when the contacts reach a useful state of equilibrium. Logic circuits are particularly sensitive to the kinetic behavior of switching contacts. Unless designed appropriately, these circuits can be triggered to produce spurious data as a result of contact bounce.
The purpose of this test method is to determine the duration of contact bounce so that it can be anticipated and provided for in user circuits. This phenomenon is defined as the random opening and closing of a switch contact that occurs after contact transfer caused by the switch mechanism. It is measured from the moment of first closure (or opening) to the moment when the contacts reach a useful state of equilibrium. Logic circuits are particularly sensitive to the kinetic behavior of switching contacts. Unless designed appropriately, these circuits can be triggered to produce spurious data as a result of contact bounce.
Collections
:
Show full item record
| contributor author | ECIA - Electronic Components Industry Association | |
| date accessioned | 2017-09-04T17:46:33Z | |
| date available | 2017-09-04T17:46:33Z | |
| date copyright | 03/01/1993 | |
| date issued | 1993 | |
| identifier other | EMLADAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=autho470393FD081D20686159DD6EFDEC9FCD0Facilities%20Engineering%20Command%226EFDEC9FCD/handle/yse/169791 | |
| description abstract | PURPOSE The purpose of this test method is to determine the duration of contact bounce so that it can be anticipated and provided for in user circuits. This phenomenon is defined as the random opening and closing of a switch contact that occurs after contact transfer caused by the switch mechanism. It is measured from the moment of first closure (or opening) to the moment when the contacts reach a useful state of equilibrium. Logic circuits are particularly sensitive to the kinetic behavior of switching contacts. Unless designed appropriately, these circuits can be triggered to produce spurious data as a result of contact bounce. | |
| language | English | |
| title | ECA EIA-448-1B | num |
| title | Method 15 Standard Test Method for Electromechanical Switches (Test for Contact Bounce) - Addendum 1 to RS-448 | en |
| type | standard | |
| page | 7 | |
| status | Active | |
| tree | ECIA - Electronic Components Industry Association:;1993 | |
| contenttype | fulltext |