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NASA-LLIS-1618
Lessons Learned - Design Circuits to Facilitate Pre-I&T Inspection (2002)
Year: 2005
Abstract: Abstract:
During Mars Exploration Rover (MER) system integration and test, it was discovered that two Rover Electronics Module (REM) heater circuits were miswired during fabrication. In addition to the lack of an ATLO test to screen such defects, testability was further constrained by inadequate test points for measuring circuit resistance. Provide for the "buzzing out" of each circuit after the build, and design in sufficient test points to get proper access to circuit resistances.
During Mars Exploration Rover (MER) system integration and test, it was discovered that two Rover Electronics Module (REM) heater circuits were miswired during fabrication. In addition to the lack of an ATLO test to screen such defects, testability was further constrained by inadequate test points for measuring circuit resistance. Provide for the "buzzing out" of each circuit after the build, and design in sufficient test points to get proper access to circuit resistances.
Subject: design-for-test
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| contributor author | NASA - National Aeronautics and Space Administration (NASA) | |
| date accessioned | 2017-09-04T18:42:37Z | |
| date available | 2017-09-04T18:42:37Z | |
| date copyright | 07/29/2005 | |
| date issued | 2005 | |
| identifier other | JZXCQCAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=authoCA5893FD081D49A96159DD6EFDEC014A/handle/yse/224077 | |
| description abstract | Abstract: During Mars Exploration Rover (MER) system integration and test, it was discovered that two Rover Electronics Module (REM) heater circuits were miswired during fabrication. In addition to the lack of an ATLO test to screen such defects, testability was further constrained by inadequate test points for measuring circuit resistance. Provide for the "buzzing out" of each circuit after the build, and design in sufficient test points to get proper access to circuit resistances. | |
| language | English | |
| title | NASA-LLIS-1618 | num |
| title | Lessons Learned - Design Circuits to Facilitate Pre-I&T Inspection (2002) | en |
| type | standard | |
| page | 3 | |
| status | Active | |
| tree | NASA - National Aeronautics and Space Administration (NASA):;2005 | |
| contenttype | fulltext | |
| subject keywords | design-for-test | |
| subject keywords | Flight Equipment | |
| subject keywords | Hardware | |
| subject keywords | Manufacturing/ Engineering | |
| subject keywords | Payloads | |
| subject keywords | Spacecraft | |
| subject keywords | Test & Verification | |
| subject keywords | Test Article | |
| subject keywords | test-induced failure |