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ECA EIA-364-25D
TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
| contributor author | ECIA - Electronic Components Industry Association | |
| date accessioned | 2017-09-04T15:33:59Z | |
| date available | 2017-09-04T15:33:59Z | |
| date copyright | 40483 | |
| date issued | 2010 | |
| identifier other | OLFUEDAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=authoCA5893FD081D527369727A00D52FAB6A/handle/yse/35690 | |
| description abstract | This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows: — to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing; — to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces). | |
| language | English | |
| title | ECA EIA-364-25D | num |
| title | TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS | en |
| type | standard | |
| page | 16 | |
| status | Active | |
| tree | ECIA - Electronic Components Industry Association:;2010 | |
| contenttype | fulltext |
