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ECA EIA-364-25D

TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS

Organization:
ECIA - Electronic Components Industry Association
Year: 2010

Abstract: This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:
— to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;
— to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).
URI: http://yse.yabesh.ir/std;query=authoCA5893FD081D527369727A00D52FAB6A/handle/yse/35690
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    ECA EIA-364-25D

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contributor authorECIA - Electronic Components Industry Association
date accessioned2017-09-04T15:33:59Z
date available2017-09-04T15:33:59Z
date copyright40483
date issued2010
identifier otherOLFUEDAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=authoCA5893FD081D527369727A00D52FAB6A/handle/yse/35690
description abstractThis standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:
— to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;
— to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).
languageEnglish
titleECA EIA-364-25Dnum
titleTP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORSen
typestandard
page16
statusActive
treeECIA - Electronic Components Industry Association:;2010
contenttypefulltext
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